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SiC MOSFETs as Enabler for the future ePowertrain and its behaviour under Short Circuit Condition

机译:SIC MOSFET作为未来扑鼻动机的推动因素及其在短路条件下的行为

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Silicon Carbide (SiC) components have been used for a number of years in industrial applications and now are progressively entering the automotive segment. The first devices of this wide-bandgap material to be used in vehicle applications were SiC diodes in on-board charger (OBC) applications. The excellent SiC diode switching performance is ideal for the freewheeling path in the power factor correction stages. The market for automotive grade SiC components is showing impressive growth aligned to the rise in electric vehicles with SiC MOSFETs being used in traction inverters as well as OBC or DC-DC converter applications. This paper explains the significant advantages that wide-bandgap technologies have compared to well establish Si technologies. This applies especially for the total cost of ownership approach, not considering the single device only but the complete application or interaction between different components. When a new semiconductor material is introduced into the automotive sector, the stringent qualification requirements mean that a special focus is needed on the manufacturing strategy. This paper also describes a manufacturing strategy designed to serve the automotive market, the key reliability factors and how improvements have been achieved. As power density of the new technology compared with Si devices is strongly increasing, simulation approaches have been introduced to characterize MOSFETs under short circuit condition to ex-plain the failure mechanism under such harsh applications conditions.
机译:碳化硅(SiC)组件已在工业应用中使用了多年,现在正在逐步进入汽车部门。在车辆应用中使用的该宽带隙材料的第一装置是板载充电器(OBC)应用中的SiC二极管。优异的SIC二极管开关性能是功率因数校正阶段的续流路径的理想选择。汽车级SIC组件的市场呈现出令人印象深刻的生长,与牵引逆变器和OBC或DC-DC转换器应用中使用的SIC MOSFET中的电动车辆的升高进行了一致。本文解释了广泛的带隙技术与井建立SI技术相比的显着优势。这适用于所有权方法的总成本,而不是考虑单个设备,而是仅考虑不同组件之间的完整应用或交互。当新的半导体材料被引入汽车部门时,严格的资格要求意味着需要特别关注制造策略。本文还描述了一种旨在为汽车市场提供服务的制造策略,关键可靠性因素以及如何实现改进。随着新技术的功率密度与SI设备相比强烈增加,已经引入了仿真方法,以在短路条件下表征MOSFET,以在这种苛刻应用条件下进行故障机制。

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