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A new Schottky-barrier GaAs epitaxial diode for infrared detection

机译:用于红外检测的新型肖特基势垒GaAs外延二极管

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While experimenting with Schottky-barrier diodes in this laboratory, an unusual I-V characteristic of a GaAs nn+epitaxial diode with Ni-Au contact was observed. The reverse characteristic is normal with a sharp breakdown voltage around 50 V. The forward clark characteristic shows no current until it breaks down at about 60 V. Under illumination, a large current flows at a forward voltage less than 1 V. The forward characteristic looks like that of an emission-saturated thermionic diode except that the saturation current increases drastically with illumination. This phenomenon is reproducible on all diodes fabricated on a certain wafer.
机译:在此实验室中对肖特基势垒二极管进行实验时,观察到了具有Ni-Au接触的GaAs nn + 外延二极管的不寻常的I-V特性。反向特性是正常的,击穿电压大约为50V。正向克拉克特性在直到大约60 V击穿之前不显示电流。在照明下,正向电压小于1 V时会流过大电流。正向特性看上去类似于发射饱和的热电子二极管,除了饱和电流随照明而急剧增加。这种现象在某个晶片上制造的所有二极管上都是可再现的。

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