I_DDQ: you heard the hype, but what's really coming?

摘要

I_DDQ testing is as old as CMOS IC technology itself. Inthe last 20 years various companies have been successful in usingI_DDQ testing where applications demanded high quality andhigh reliability ICs, while many others have failed. Failure to besuccessful with I_DDQ has many causes: it is too slow forproduction testing, the yield loss too great, ICs are leaking too muchcurrent, the process is too leaky, nobody can select the vectors.I_DDQ testing has never broken through into the mainstream ofIC testing for many reasons. The author assesses whether this is goingto happen in 1996 or whether this is just another cyclical re-appearanceof an old idea