首页> 外文会议>Asia Pacific Conference on Optics Manufacture;Society of Photo-Optical Instrumentation Engineers;Moore Nanotechnology Systems LLC >Modeling and Experiment of Concave Microlens Array on Silicon Wafer by Grinding-Polishing Process with Diamond Slurry
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Modeling and Experiment of Concave Microlens Array on Silicon Wafer by Grinding-Polishing Process with Diamond Slurry

机译:金刚石浆料磨抛工艺在硅片上凹型微透镜阵列的建模与实验

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Silicon wafers with micro patterns have been increasingly required in advanced optics for excellent optical performancein the infrared region. However, the costly and inefficient fabricating methods for them severely limit their applications.In this work, we present an economic and efficient grinding-polishing approach for fabricating concave microlens arrayon silicon wafers. Different from traditional processes for microlens array on silicon wafers, the paper demonstrates achemical mechanical grinding-polishing (CMGP) process by grinding micro cavities on silicon wafer and then polishingthem to precision concave microlenses with ball-end tool, polishing pad and diamond slurry. A new experimental setupwith entire mechanical structure and electronic control program was established to validate the feasibility of this newmethod. During the CMGP process, in order to gain microlens array with specific apertures, a material removal modelfor micro cavity grinding process was established to accurately calculate cavity depth by using grinding parameters andthe model was validated by grinding experiments. Guided by this model, a 10 ×10 large-area microlens array wasfabricated on silicon wafer. In addition, the surface profiles and roughnesses of the microlens array were also evaluated.
机译:具有微观图案的硅晶片在先进的光学中越来越需要进行优异的光学性能 在红外地区。然而,对它们的昂贵和低效的制造方法严重限制了它们的应用。 在这项工作中,我们提出了一种制造凹微透镜阵列的经济高效的研磨抛光方法 在硅晶片上。与硅晶片上的微透镜阵列的传统过程不同,本文演示了一个 通过在硅晶片上研磨微腔然后抛光通过化学机械研磨抛光(CMGP)工艺 它们用球端工具,抛光垫和金刚石浆料精密凹微透镜。一个新的实验设置 建立了整个机械结构和电子控制程序以验证新的新的可行性 方法。在CMGP过程中,为了获得具有特定孔的微透镜阵列,材料去除模型 对于微腔研磨过程,建立了通过使用研磨参数来精确计算腔深度 通过研磨实验验证该模型。由此模型引导,一个10×10大区域微透镜阵列 在硅晶片上制造。另外,还评估了微透镜阵列的表面谱和粗糙度。

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