首页> 外文会议>Electronic Components amp; Technology Conference, 1998. 48th IEEE >Flow properties of liquid underfill encapsulations and underfillprocess considerations
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Flow properties of liquid underfill encapsulations and underfillprocess considerations

机译:液体底部填充胶和底部填充胶的流动特性工艺考虑

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The underfill encapsulation process and corresponding underfillflow behavior are studied numerically and experimentally. A 2-D volumeof fluid (VOF) FLUENT model was used to better simulate one-sideunderfill flow compared to a pre-existing analytical model. For thetwo-side underfill flow, a 3-D flow model based on the Hele-Shawapproximation was created to calculate the process time. A 2-Danalytical model was also modified by including a body force to simulateinclined underfill flow. Experiments were performed to verify thenumerical model, and good agreement was observed for the flow time andflow distance relationship for different processes. Experiments atvarying temperatures allowed the inference of the encapsulant's strongtemperature dependent viscosity and of an optimal temperature for theunderfill process. Experimental results also revealed that dispensingfrom more than one side of the chip changed the underfill flow behaviorand thus changed the process time. We also noted that the addition ofcenter bumps increases the fill time compared to just edge bumps.However, for two different densities of center bumps, no significantdifference on the total underfill time was observed
机译:底部填充封装过程和相应的底部填充 对流动行为进行了数值和实验研究。二维体积 流体(VOF)FLUENT模型用于更好地模拟一侧 与预先存在的分析模型相比的底部填充流量。为了 两侧底部填充流动,基于Hele-Shaw的3-D流动模型 创建近似值以计算处理时间。二维 分析模型也进行了修改,其中包括要模拟的体力 倾斜的底部填充流量。进行实验以验证 数值模型,并观察到良好的流动时间和一致性 不同过程的流动距离关系。实验于 温度的变化可以推断出密封剂的强度 温度相关的粘度和最佳温度 底部填充过程。实验结果还表明,点胶 从芯片的多个侧面改变了底部填充流动行为 从而改变了处理时间。我们还注意到,除了 与仅边缘凸起相比,中心凸起会增加填充时间。 但是,对于中心凸点的两种不同的密度,没有明显的影响。 观察到总未充满时间的差异

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