首页> 外文会议>Electronic Components Technology Conference, 1998. 48th IEEE >Flow properties of liquid underfill encapsulations and underfill process considerations
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Flow properties of liquid underfill encapsulations and underfill process considerations

机译:液体底部填充胶的流动特性和底部填充工艺注意事项

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The underfill encapsulation process and corresponding underfill flow behavior are studied numerically and experimentally. A 2-D volume of fluid (VOF) FLUENT model was used to better simulate one-side underfill flow compared to a pre-existing analytical model. For the two-side underfill flow, a 3-D flow model based on the Hele-Shaw approximation was created to calculate the process time. A 2-D analytical model was also modified by including a body force to simulate inclined underfill flow. Experiments were performed to verify the numerical model, and good agreement was observed for the flow time and flow distance relationship for different processes. Experiments at varying temperatures allowed the inference of the encapsulant's strong temperature dependent viscosity and of an optimal temperature for the underfill process. Experimental results also revealed that dispensing from more than one side of the chip changed the underfill flow behavior and thus changed the process time. We also noted that the addition of center bumps increases the fill time compared to just edge bumps. However, for two different densities of center bumps, no significant difference on the total underfill time was observed.
机译:数值和实验研究了底部填充胶的封装过程和相应的底部填充胶流动性。与预先存在的分析模型相比,使用二维体积的流体(VOF)FLUENT模型可以更好地模拟单侧底部填充流量。对于两侧底部填充流,创建了基于Hele-Shaw近似的3-D流模型以计算处理时间。还通过包括体力来模拟倾斜的底部填充流的二维分析模型。进行了实验以验证数值模型,并且观察到了不同过程的流动时间和流动距离关系的良好一致性。在不同温度下进行的实验可以推断出密封剂的强温度依赖性粘度和底部填充工艺的最佳温度。实验结果还表明,从芯片的多个侧面进行分配可以改变底部填充胶的流动性,从而改变处理时间。我们还注意到,与仅边缘凸块相比,添加中心凸块会增加填充时间。但是,对于两种不同密度的中心凸点,未观察到总底部填充时间的显着差异。

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