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Statistical Analysis of Effective Piezoresistivity of Carbon Nanotube Reinforced Polymer Nanocomposites from Electron Tunneling Effects

机译:从电子隧穿效应对碳纳米管增强聚合物纳米复合材料有效压阻的统计分析

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CNT doped polymers exhibit piezoresistivity due to a combination of phenomena occurring at the nanoscale and microscale length scales. These effects manifest into an observable piezoresistive response in macroscale specimens. One of these effects - electron tunneling, is a significant contributor to the overall piezoresistive response and acts in the nanoscale regime. It is a quantum phenomenon where electrons jump across insulating dielectric media from one conductive domain to another. The extent of the derived piezoresistivity due to electron tunneling depends upon various factors such as concentration of CNTs, size and shape of CNTs, orientation and distribution of CNTs and the properties of the CNT and the surrounding polymer. This study aims to understand the variation in the piezoresistive effect derived from the electron tunneling effect by analyzing each of the aforementioned factors individually and as groups. Several nanoscale computational domains or RVEs (representative volume elements) are generated for each combination of factors selected through a randomized 2D nanocomposite configuration generation algorithm. The generated RVEs are analyzed using a 2D quasi static electromechanical finite element model under various conditions of loading and electrode placement to fully populate the effective piezoresistivity strain coefficient tensor Π_(ijkl) Large data sets gathered from analysis of several configurations were used to perform statistical significance testing of the derived piezoresistive coefficients and their dependence on the suggested factors. Conclusions from this study also aided in establishing expected variation in conductivity and piezoresistivity values for CNT doped polymers for different configurations.
机译:由于在纳米级和微米级长度尺度上发生的现象的结合,CNT掺杂的聚合物表现出压阻性。这些影响表现为在大型标本中可观察到的压阻响应。这些效应之一-电子隧穿是整个压阻响应的重要贡献者,并在纳米尺度范围内发挥作用。这是一种量子现象,其中电子从一个导电域跨过绝缘介电介质跳到另一个导电域。由于电子隧穿而产生的压阻率的程度取决于各种因素,例如CNT的浓度,CNT的尺寸和形状,CNT的取向和分布以及CNT和周围聚合物的性能。本研究旨在通过单独或分组分析上述每个因素,来了解由电子隧穿效应引起的压阻效应的变化。对于通过随机2D纳米复合材料配置生成算法选择的因子的每种组合,都会生成几个纳米级计算域或RVE(代表性体积元素)。在各种载荷和电极放置条件下,使用2D准静态机电有限元模型分析生成的RVE,以完全填充有效的压阻应变系数张量Π_(ijkl)。使用从几种配置分析中收集的大数据集来进行统计显着性分析测试派生的压阻系数及其对建议因素的依赖性。这项研究的结论还有助于建立不同构型的CNT掺杂聚合物的电导率和压阻率值的预期变化。

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