Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis

摘要

Since the structure and function of IC (Integrated Circuit) is becoming complicated, locating the defect precisely is facing more challenges. Non-destructive analysis strategy would be much more important than ever before. This paper would present an efficient strategy to locate the defect on capacitor with simulation EMMI analysis. This non-destructive strategy can be considered when meet the output signal failed which with complicated feedback circuit.