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Solving Time Dependent IC Failures Through Unorthodox Emission Microscopy Technique

机译:通过非正统发射显微镜技术解决与时间有关的IC故障

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The authors have utilized an unorthodox Photon Emission Microscopy (PEM) technique equipped with an Indium Gallium Arsenide (InGaAs) detector to identify the root-cause of two time dependent IC failure cases. These two cases consist of a delay fault for less than 15ms and a failing device after more than 19 minutes of operation. Results on both cases show proof that our unorthodox PEM fault isolation approach can be a valuable approach to successfully solve challenging time dependent IC failure in the absence of a Time Resolved Emission (TRE) microscopy tool.
机译:作者已经利用装备有砷化铟镓(InGaAs)检测器的非正统光子发射显微镜(PEM)技术来确定两个时间相关的IC故障案例的根本原因。这两种情况都包括少于15ms的延迟故障和超过19分钟的运行后的设备故障。两种情况下的结果都证明,在没有时间分辨发射(TRE)显微镜工具的情况下,我们非传统的PEM故障隔离方法可以是成功解决具有挑战性的依赖时间的IC故障的宝贵方法。

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