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Thermal Analysis of Lateral GaN HEMT Devices for High Power Density Integrated Motor Drives Considering the Effect of PCB Layout and Parasitic Parameters

机译:考虑PCB布局和寄生参数的高功率密度集成电机驱动器横向GaN HEMT器件的热分析

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A high power density inverter is one of the most important design requirements for a compact and energy-efficient integrated motor drive (IMD) design. Agallium nitride (GaN) high electron mobility transistor (HEMT) has a lateral device structure with land grid array (LGA) or ball grid array (BGA) package for minimum parasitic inductance and resistance, which is also advantageous in a thermal management. This paper presents a new thermal management methodology for a high power density IMD using GaN HEMTs. An optimized printed circuit board (PCB) design is investigated for an effective bottom-side cooling method without any heatsink. The parasitic components are also analytically estimated to prove the validity of the proposed circuit design.
机译:高功率密度逆变器是紧凑型和节能型集成电动机驱动器(IMD)设计的最重要设计要求之一。氮化镓(GaN)高电子迁移率晶体管(HEMT)具有横向器件结构,具有焊盘栅格阵列(LGA)或球栅阵列(BGA)封装,以实现最小的寄生电感和电阻,这在热管理中也是有利的。本文介绍了一种使用GaN HEMT的高功率密度IMD的新热管理方法。研究了一种优化的印刷电​​路板(PCB)设计,以实现一种有效的无散热片的底部冷却方法。还对寄生元件进行了分析估计,以证明所提出的电路设计的有效性。

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