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Thermal Analysis of Lateral GaN HEMT Devices for High Power Density Integrated Motor Drives Considering the Effect of PCB Layout and Parasitic Parameters

机译:考虑PCB布局和寄生参数效果的高功率密度集成电路驱动横向GaN HEMT装置的热分析

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摘要

A high power density inverter is one of the most important design requirements for a compact and energy-efficient integrated motor drive (IMD) design. Agallium nitride (GaN) high electron mobility transistor (HEMT) has a lateral device structure with land grid array (LGA) or ball grid array (BGA) package for minimum parasitic inductance and resistance, which is also advantageous in a thermal management. This paper presents a new thermal management methodology for a high power density IMD using GaN HEMTs. An optimized printed circuit board (PCB) design is investigated for an effective bottom-side cooling method without any heatsink. The parasitic components are also analytically estimated to prove the validity of the proposed circuit design.
机译:高功率密度逆变器是紧凑型节能集成电机驱动(IMD)设计的最重要的设计要求之一。氮化镓(GaN)高电子迁移率晶体管(HEMT)具有横向装置结构,其具有陆地网格阵列(LGA)或球栅阵列(BGA)封装,用于最小寄生电感和电阻,这在热管理中也是有利的。本文介绍了使用GaN Hemts的高功率密度IMD的新热管理方法。针对没有任何散热器的有效底侧冷却方法研究了优化的印刷电​​路板(PCB)设计。还在分析寄生成分估计以证明所提出的电路设计的有效性。

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