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Fast switching performance by 20 A / 730 V AlGaN/GaN MIS-HFET using AlON gate insulator

机译:使用AlON栅极绝缘体的20 A / 730 V AlGaN / GaN MIS-HFET的快速开关性能

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摘要

In this paper, high current and high voltage AlGaN/GaN metal-insulator-semiconductor (MIS) heterojunction field-effect transistors (HFETs) on Si are demonstrated. The devices exhibit a drain current of 20 A as well as a breakdown voltage of 730 V, serving normally-off operations. Stable interfacial characteristics free from the hysteresis in the transfer characteristics are enabled by the introduction of AlON gate insulator. A recessed gate structure formed by epitaxial regrowth of AlGaN over the grooved AlGaN/GaN heterojunction successfully reduces the on-state resistance and eliminates the processing damage on the surface of the grooved structure. Note that an oxygen annealing followed by the deposition of AlON shifts the threshold voltage Vth to positive side. The resultant switching performance by the 20 A / 730 V AlGaN/GaN MIS-HFET is very fast with dV/dt of 78 Vs and 169 Vs for turn-on and turn-off transitions, respectively, indicating that the proposed MIS-HFETs are very promising for practical power switching applications.
机译:在本文中,对Si上的高电流和高电压AlGaN / GaN金属绝缘体半导体(MIS)异质结场效应晶体管(HFET)进行了演示。这些器件的漏极电流为20 A,击穿电压为730 V,可用于常关操作。通过引入AlON栅极绝缘体,可以实现稳定的界面特性,而不会出现传输特性中的滞后现象。通过在凹槽的AlGaN / GaN异质结上通过AlGaN的外延再生长而形成的凹入的栅极结构成功地减小了导通电阻,并消除了凹槽结构表面上的工艺损伤。注意,氧退火之后沉积AlON将阈值电压V th 移到正侧。 20 A / 730 V AlGaN / GaN MIS-HFET的合成开关性能非常快,其导通和关断转换的dV / dt分别为78 V / ns和169 V / ns。 MIS-HFET在实际功率开关应用中非常有前途。

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