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Analysis of various parameters of double gate junctionless MOSFET using Ge-source with High-k Spacer

机译:使用高k隔离层的Ge源双栅极无结MOSFET的各种参数分析

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The enhanced performance of a Symmetrical Double Gate Junctionless MOSFET (DG JL MOSFET) is presented using Germanium Material as Source. The characteristics of Ge-Source DG JL MOSFET are compared with Si-Source and demonstrated by simulating with Sentaurus TCAD Toolkit. Germanium with high mobility and lower band gap provides an improvement in various parameters like On Current (Ion), Off current (Ioff), subthreshold swing (SS), Threshold Voltage (Vth) and Ion-Ioff ratio. The parameter values are improved further for Ge-Source along with High-k Spacer because High-k Dielectric material increases On current and reduces the leakage current.
机译:以锗材料为源,提出了对称双栅极无结MOSFET(DG JL MOSFET)的增强性能。 Ge-Source DG JL MOSFET的特性与Si-Source进行了比较,并通过Sentaurus TCAD Toolkit进行了仿真演示。高迁移率和较低带隙的锗提供了各种参数的改进,例如导通电流(I on ),截止电流(I off ),亚阈值摆幅(SS),阈值电压(V th )和I on -I off 的比率。由于高k介电材料增加了导通电流并减小了泄漏电流,因此与高k间隔器一起进一步改善了锗源的参数值。

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