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Performance Comparison of fast Silicon and Silicon Carbide Devices Used with Conventional PCBs and Embedded into PCBs

机译:与常规PCB一起使用并嵌入到PCB中的快速硅和碳化硅器件的性能比较

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Modern semiconductor switches based on silicon carbide (SiC), gallium nitride (GaN) but also Silicon (Si) cause higher and higher di/dt and dv/dt magnitudes in power electronic circuits. To utilize maximum switching efficiency and achieve minimum over voltages at the devices commutation loops have to be designed very carefully. One option to minimize commutation inductance is the embedding of the semiconductor chip into the printed circuit board itself. The presented paper compares silicon and silicon carbide switching devices experimentally both with conventional PCB operation and embedded into PCBs, manufactured by TU Berlin and RUWEL International within the project FLIP, funded by the German government.
机译:基于碳化硅(SiC),氮化镓(GaN)以及硅(Si)的现代半导体开关在电力电子电路中导致越来越高的di / dt和dv / dt幅度。为了利用最大的开关效率并在器件上实现最小的过电压,必须非常仔细地设计换向环路。最小化换向电感的一种选择是将半导体芯片嵌入印刷电路板本身。本文通过实验比较了硅和碳化硅开关设备与常规PCB操作以及嵌入在TU柏林和RUWEL International在德国政府资助的FLIP项目中制造的PCB中的实验结果。

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