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Design and Analysis of Novel InSb/Si Heterojunction Double Gate Tunnel Field Effect Transistor

机译:新型InSb / Si异质结双栅极隧道场效应晶体管的设计与分析

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In this work, an InSb/Si heterojunction hetero gate dielectric double gate TFET (HTFET) having a split pocket at Source-Channel junction has been designed and its analog/RF performance has been investigated. The analog/RF performance of the device is analysed in terms of I-V characteristics, transconsuctance (gm), parasitic capacitances, cut-off frequency (fT) and gain bandwidth product (GBW). Maximum fT of 777.8 GHz, maximum GBW of 393 GHz and a ION/IOFF ratio of 1010 were obtained from the simulations carried out. Further, circuit level performance analysis is performed by implementing a common source (CS) amplifier based on HTFET, using look-up table based Verilog-A model; a 3-dB roll-off frequency of 55.0981 GHz and unity gain cut-off frequency of 1.4652 THz were achieved.
机译:在这项工作中,设计了在源沟道结处有裂口的InSb / Si异质结异质栅介电双栅极TFET(HTFET),并研究了其模拟/ RF性能。根据I-V特性,跨导(gm),寄生电容,截止频率(fT)和增益带宽乘积(GBW)来分析器件的模拟/ RF性能。从进行的仿真中获得了777.8 GHz的最大fT,393 GHz的最大GBW和ION / IOFF比率为1010。此外,通过使用基于查找表的Verilog-A模型实现基于HTFET的共源(CS)放大器,可以进行电路级性能分析。 3dB滚降频率为55.0981 GHz,单位增益截止频率为1.4652 THz。

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