Reduced March iC- Test for Detecting Ageing Induced Faults in Memory Address Decoders

摘要

Life critical applications like automotive applications use a huge amount of on-chip SRAMs for various functions, including driver assist. Today's automotive applications use many electronic components to improve safety, fuel efficiency, and driving experience. Therefore, SRAMs have to be made resilient to errors, and errors appearing in the periphery of SRAMs should be detected and highlighted before the failure appears. Hence, several ageing related faults that occur in SRAMs, need to be tested every time the device is powered on. So, time plays a vital role during SRAM testing. In this paper, we propose a new test algorithm to detect address decoder open faults that are induced by ageing related to Electromigration and Bias Temperature Instability. These faults are injected in the address decoder, and its detection is done by applying the proposed new algorithm called reduced March iC- test, it is found that the test time reduces by 30% as compared to conventional and widely used March iC- Test.