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SRAM cell with improved stability and reduced leakage current for subthreshold region of operation

机译:SRAM单元具有更高的稳定性,并降低了亚阈值操作区域的泄漏电流

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In this paper, a Modified Differential 8T SRAM cell is proposed for subthreshold region of operation. Forward Body biasing technique is used to improve the drivability of transistors and sleep transistor logic is used to reduce the leakage current in standby mode. The proposed design is implemented with 45 nm CMOS technology and is simulated using Cadence Virtuoso Simulator. At 0.5 V supply voltage, the read SNM and write SNM are 98 mV and 112 mV respectively and these are 32% and 21% higher than there reported in literature. The leakage current and power consumption of the cell are 3.26 fA and 1.63 fW respectively.
机译:本文提出了一种修改的差分8T SRAM单元,用于亚阈值操作区域。用于提高晶体管的驾驶能力,睡眠晶体管逻辑用于降低待机模式下的漏电流的转发体偏置技术。所提出的设计采用45nm CMOS技术实现,并使用Cadence Virtuoso模拟器进行模拟。在0.5V电源电压下,读取的SNM和写入SNM分别为98mV和112mV,而且它们比文献中报告的32%和21%。电池的漏电流和功耗分别为3.26AB和1.63 FW。

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