首页> 外文会议>Symposium on VLSI Technology >Fully-depleted planar technologies and static RAM
【24h】

Fully-depleted planar technologies and static RAM

机译:完全耗尽的平面技术和静态RAM

获取原文

摘要

Key elements of FDSOI (Fully Depleted Silicon on Insulator) technology as applied to SRAMs are described. Thick- and thin-Bottom Oxide (BOX) variants are discussed. Introduction Fully-depleted transistor technologies, both planar and fin-type, are now in the mainstream [1–4]. They offer unique promise to important circuits such as static RAM cells. Planar fully-depleted devices come in two flavors: extremely thin silicon on a thick BOX or on a thin BOX. The latter configuration allows for spatial and/or temporal modulation of the devices through the potential on the underlying bulk silicon (Fig. 1).
机译:描述了应用于SRAM的FDSOI(绝缘体上完全耗尽的硅)技术的关键要素。讨论了厚底氧化物和薄底氧化物(BOX)。引言平面和鳍式全耗尽晶体管技术现已成为主流[1-4]。它们为重要电路(例如静态RAM单元)提供了独特的保证。平面完全耗尽的器件有两种形式:厚BOX或薄BOX上的极薄硅。后一种配置允许通过下面的体硅上的电势对设备进行空间和/或时间调制(图1)。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号