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A conceptual simulation framework for the performance assessment of lot release policies

机译:批量释放政策性能评估的概念模拟框架

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This paper presents a conceptual simulation framework (CSF) for the assessment of lot release policies on selected performance metrics, such as cycle time, WIP level and throughput rate. The development of a CSF is derived from the analysis of the semiconductor wafer fabrication, which is perhaps one of the most complex manufacturing processes found today. Due to economic efficiency and increased complexity, simulation emerges as a powerful technique that can capture and analyse such complex systems. The CSF which is developed here is expected to improve the productivity of simulation analyses and furthermore, it reduces the preparing time for input data and errors.
机译:本文提出了一个概念模拟框架(CSF),用于评估所选性能指标的批量发布策略,例如循环时间,WIP级别和吞吐率。 CSF的开发源自半导体晶片制造的分析,这可能是今天发现的最复杂的制造过程之一。 由于经济效率和复杂性增加,仿真是一种能够捕获和分析这些复杂系统的强大技术。 此处开发的CSF预计将提高模拟分析的生产率,此外,它减少了输入数据和错误的准备时间。

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