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Thin film transistors with wurtzite ZnO channels grown on Si_3N_4/SiO_2/Si (111) substrates by pulsed laser deposition

机译:通过脉冲激光沉积在Si_3N_4 / SiO_2 / Si(111)衬底上生长的具有纤锌矿型ZnO沟道的薄膜晶体管

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Thin Film Transistors (TFT) were made by growing ZnO on Si_3N_4/SiO)2/Si (111) substrates by pulsed laser deposition. X-ray diffraction and scanning electron microscope studies revealed the ZnO to have a polycrystalline wurtzite structure with a smooth surface, good crystallographic quality and a strong preferential c-axis orientation. Transmission studies in similar ZnO layers on glass substrates showed high transmission over the whole visible spectrum. Electrical measurements of a back gate geometry FET showed an enhancement-mode response with hard saturation, mA range Id and a V_(ON) ~ 0V. When scaled down, such TFTs may be of interest for high frequency applications.
机译:薄膜晶体管(TFT)是通过在Si_3N_4 / SiO)2 / Si(111)衬底上通过脉冲激光沉积生长ZnO制成的。 X射线衍射和扫描电子显微镜研究表明,ZnO具有多晶纤锌矿结构,具有光滑的表面,良好的晶体学质量和强的优先c轴取向。在玻璃基板上类似的ZnO层中进行的透射研究表明,在整个可见光谱范围内具有较高的透射率。背栅几何FET的电学测量显示出增强模式响应,具有硬饱和,mA范围ID和V_(ON)〜0V。当按比例缩小时,这种TFT对于高频应用可能是令人感兴趣的。

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