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Build-up electrical insulation material with low-dielectric tangent, low-CTE and low-surface roughness

机译:具有低介电正切,低CTE和低表面粗糙度的积层电绝缘材料

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With the increasing speed of information and communications equipment in recent years, together with high-speed signal processing of LSIs, there is a requirement for build-up electrical insulation materials to be used as IC package substrates with low-dielectric tangent, and to reduce the dielectric loss to achieve low transmission loss in the high-frequency GHz bands. At the same time, there is an increasing need for low-CTEs (Coefficient of Thermal Expansion) to ensure highly reliable substrates. With our formulation technology, we have developed a next-generation film-shaped build-up electrical insulation material compatible with high-frequency signal transmission by using composition of practical thermosetting epoxy resin, that has realized both a low-dielectric tangent and a low-CTE at the same time. Furthermore, this material can show a low-surface roughness after the film desmear process. It is thus expected to help reduce not only the dielectric loss by low-dielectric tangent but also the conductor loss caused by the skin effect, and promote the fine line formation by SAP (Semi Additive Process).
机译:近年来,随着信息和通信设备速度的提高以及LSI的高速信号处理,要求将积层的电绝缘材料用作具有低介电常数的IC封装基板,并减少介电损耗,以在高频GHz频段实现低传输损耗。同时,为了确保高度可靠的基板,对低CTE(热膨胀系数)的需求日益增长。利用我们的配方技术,我们通过使用实用的热固性环氧树脂的成分,开发了与高频信号传输兼容的下一代薄膜状积层电绝缘材料,该材料既实现了低介电切线又实现了低介电常数。同时CTE。此外,该材料在膜去污工艺之后可以显示出低的表面粗糙度。因此,期望不仅有助于降低低介电常数的切线引起的介电损耗,而且还有助于降低由集肤效应引起的导体损耗,并有助于通过SAP(半添加法)形成细线。

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