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Lifetime prediction and impact factors analysis of ball grid array solder joint based on FEA

机译:基于有限元分析的球栅阵列焊点寿命预测及影响因素分析

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In electronic product, reliability of solder joint has big impact on the function of the whole electronic product. In the design period of the package, it is important to predict solder joint thermal fatigue lifetime and analyze the effect of each factors on the lifetime of solder joint. Finite Element Analysis (FEA) based solder joint lifetime prediction method, which used Anand viscoplastic constitutive function and Darveaux lifetime perdition model is programmed use Visual Basic language. With this software, effect of temperature, solder material, height, diameter and gap of solder joint, thickness, Young's modulus and CTE of substrate on solder joint lifetime are analyzed. Results show that these factors have different effect on solder joint life which is benefit to the optimization of package structure.
机译:在电子产品中,焊点的可靠性对整个电子产品的功能有很大的影响。在封装的设计阶段,重要的是预测焊点的热疲劳寿命,并分析各个因素对焊点寿命的影响。基于有限元分析(FEA)的焊点寿命预测方法,该方法使用Anand粘塑性本构函数,并使用Visual Basic语言对Darveaux寿命折旧模型进行编程。使用该软件,分析了温度,焊料材料,高度,焊点间隙和间隙,厚度,杨氏模量和基板的CTE对焊点寿命的影响。结果表明,这些因素对焊点寿命有不同的影响,有利于封装结构的优化。

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