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Adaptive OPC approach based on image simulation

机译:基于图像仿真的自适应OPC方法

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With the design rule shrinks rapidly, full chip robust Optical Proximity Correction (OPC) will definitely need longer time due to the increasing pattern density. Furthermore, to achieve a perfect OPC control recipe becomes more difficult. For, the critical dimension of the design features is deeply sub exposure wavelength, and there is only limited room for the OPC correction. Usually very complicated fragment commands need to be developed to handle the shrinking designs, which can be infinitely complicated. So when you finished debug a sophisticated fragment scripts, you still cannot promise that the script is universal for all kinds of design. And when you find some hot spot after you apply OPC correction for certain design, the only thing you can do is to modify your fragmentation script and try to re-apply OPC on this design. But considering the increasing time that is needed for applying full chip OPC nowadays, re-apply OPC will definitely prolong the tape-out time. We here demonstrate an approach of adaptive OPC, with which automatic fragmentation adjustment can be realized. And this will be helpful to reduce the difficulty for OPC recipe development.
机译:随着设计规则的迅速缩小,由于图案密度的增加,全芯片鲁棒的光学邻近校正(OPC)肯定需要更长的时间。此外,实现完美的OPC控制配方变得更加困难。因此,设计特征的关键尺寸是深亚曝光波长,并且OPC校正的空间非常有限。通常,需要开发非常复杂的片段命令来处理不断缩小的设计,而这可能是无限复杂的。因此,当您调试完复杂的片段脚本后,仍然不能保证该脚本对于所有类型的设计都是通用的。而且,当您对某些设计应用OPC校正后发现某个热点时,您唯一可以做的就是修改碎片脚本,并尝试在此设计上重新应用OPC。但是考虑到当今应用全芯片OPC所需的时间增加,重新应用OPC肯定会延长流片时间。我们在这里演示了一种自适应OPC的方法,利用该方法可以实现自动分段调整。这将有助于减少OPC配方开发的难度。

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