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A 7.9/5.5 psec room/low temperature SOI CMOS

机译:7.9 / 5.5 psec室温/低温SOI CMOS

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In this paper we demonstrate the fastest CMOS circuits reported to date. At room temperature the unloaded CMOS inverter delay as low as 7.85 psec is measured. This number drops to 5.5 psec at liquid nitrogen temperature. The devices used in the study are built on SOI, with excellent short-channel characteristics down to 0.06 /spl mu/m for the NFETs and 0.08 /spl mu/m for the PFETs. Although devices with high threshold voltages are used, record delays are achieved at relatively low supply voltages. At 1.8 V, the inverter delay is 8.3 psec and 5.9 psec at T=300 K and T=80 K, respectively. The corresponding delays at 1.2 V are 11.4 psec and 8.2 psec. Through proper device optimization, we demonstrate that undesired SOI floating-body effects are minimized as well. These results demonstrate that there is significant room for continued performance enhancement in scaled CMOS.
机译:在本文中,我们演示了迄今为止报道的最快的CMOS电路。在室温下,测得的空载CMOS反相器延迟低至7.85 psec。在液氮温度下,该数字下降到5.5皮秒。该研究中使用的器件基于SOI,具有出色的短沟道特性,对于NFET而言低至0.06 / spl mu / m,对于PFET而言低至0.08 / spl mu / m。尽管使用具有高阈值电压的设备,但记录延迟是在较低的电源电压下实现的。在1.8 V时,在T = 300 K和T = 80 K时,反相器延迟分别为8.3 psec和5.9 psec。 1.2 V时的相应延迟为11.4 psec和8.2 psec。通过适当的器件优化,我们证明了不希望出现的SOI浮体效应也已最小化。这些结果表明,在按比例缩放的CMOS中,仍有很大的空间可以继续提高性能。

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