A test methodology to monitor and predict early life reliability failure mechanisms

摘要

A description is given of a test methodology called operational life testing (OLT), which has been implemented to monitor and quantify the early-life reliability of selected semiconductor technologies and identify early-life failure mechanisms. This monitor measures the effectiveness of screens and tests used to remove device infant-mortality failure modes. In addition, the early-life reliability monitor complements the data derived from highly accelerated long-term reliability tests since it highlights specific failure modes which are not predominant in highly accelerated long-term reliability tests. Information gained from the monitor can be used to implement tests and screens designed to eliminate certain failure modes in a more timely manner than accumulating and analyzing field return data.