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Method of predicting lifetime of semiconductor integrated circuit and method for reliability testing of the circuit
Method of predicting lifetime of semiconductor integrated circuit and method for reliability testing of the circuit
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机译:预测半导体集成电路寿命的方法和电路可靠性测试的方法
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摘要
A time it takes for a total leakage current (i.e., a total amount of B-mode stress induced leakage currents) flowing through respective MOS devices in a semiconductor integrated circuit to reach a predetermined reference level is estimated as an expected lifetime of the circuit.
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