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Deposition of In_2O_3-Al_2O_3-SnO_2 (IATO) transparent conduction thin films using non-vacuum method

机译:使用非真空法沉积In_2O_3-AL_2O_3-SNO_2(IATO)透明导电薄膜

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The In_2O_3-Al_2O_3-SnO_2 (In:Al:Sn = 68.8:11.8:8.4, IATO) transparent conduction thin films were synthesized by using the non-vacuum Spray Coating Method (SCM). At first, the IATO power was mixed, calcined at 1100°C, and ground into nano-scale particles, then the 6 wt% IATO particles were dispersed into isopropyl alcohol (IPA) to get the solution for SCM. 0.1 ml IATO solution was sprayed on the 2 cm × 1 cm glass substrates and then the nano-scale IATO solution was carried out the thermal treatment under different temperatures in a furnace in air. The annealing temperature was changed from 200°C to 800°C and the annealing time was 3 h. After annealing, the influences of the annealing temperature on crystallization of the IATO thin films were investigated. The surface and cross-section morphologies, optical transmission ratio, resistivity (ρ), hall mobility (μ), and carrier concentration of the IATO thin films were well investigated in this study.
机译:通过使用非真空喷涂方法(SCM)合成了IN_2O_3-AL_2O_3-SNO_2(:A1:SN = 68.8:11.8:8.4,IATO)透明导电薄膜。首先,将IATO功率混合,在1100℃下煅烧,然后将6wt%IATO颗粒分散到异丙醇(IPA)中以获得SCM的溶液。将0.1ml IATO溶液喷雾在2cm×1cm玻璃基板上,然后在空气中的炉中的不同温度下进行纳米级IATO溶液进行热处理。退火温度从200℃变为800℃,退火时间为3小时。退火后,研究了退火温度对IATO薄膜结晶的影响。在本研究中,很好地研究了表面和横截面形态,光学传动比,电阻率(ρ),霍尔迁移率(μ)和IATO薄膜的载体浓度。

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