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A Non-Resonant Recessed Gate AlGaN/GaN HEMT Terahertz Detector

机译:非共振嵌入式闸门AlGaN / GaN Hemt太赫兹检测器

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A plasma wave device model for THz non-resonant detection is proposed in this paper. The recessed gate (RE) enhanced AlGaN/GaN HEMT structure is adopted for enhancing the detection responsivity with its excellent 2DEG channel controlling. The detector is worked at Dyakonov-Shur instability condition and the radiation frequency detected is in the range of THz. Hydrodynamic equations and asymmetric B.C. are modeled for the plasma device while detection responsivity $(R_{mathrm{v}})$ and noise equivalent power (NEP) are modeled by channel conductance. The numerical results in TCAD show the detection responsivity is 1.3 times higher than conventional single-channel (SC) AlGaN/GaN HEMT with keeping a low NEP of 60 pW/Hz0.5, which indicates potential of RE _ HEMT devices in THz detectors.
机译:本文提出了一种用于THz非共振检测的等离子体波器件模型。 采用嵌入式闸门(RE)增强的AlGaN / GaN HEMT结构,用于提高其优异的2DEG通道控制的检测响应性。 检测器在Dyakonov-Shur不稳定状态下工作,并且检测到的辐射频率位于THz的范围内。 流体动力学方程和不对称的B.C. 在检测响应率的同时为等离子体器件进行建模 $(r _ { mathrm { v}})$ 和噪声等效功率(NEP)通过信道电导进行建模。 TCAD中的数值结果显示,检测响应率比传统单通道(SC)AlGaN / GaN HEMT高1.3倍,具有保持60 PW / Hz的低NEP 0.5 ,这表示THz探测器中RE _ HEMT设备的潜力。

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