Electrostatic Discharge (ESD) and Electrical Overstress (EOS) — The state of the art for methods of failure analysis, and testing in components and systems

摘要

Electrostatic Discharge (ESD) and Electrical Overstress (EOS) continue to impact semiconductor components and systems as technologies scale from micro-to nano-electronics. This paper focuses on the state of the art of electrostatic discharge (ESD) and electrical overstress (EOS), with an emphasis on failure mechanisms and testing. The tutorial provides a clear picture of EOS phenomena, ESD and EOS failure mechanisms, testing and testing standards, and new failure analysis techniques.