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Failure analysis of die-bonding interfaces between LED chip and heat sink

机译:LED芯片与散热器之间芯片键合界面的失效分析

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The die bonding technology played a key role during the heat dissipating process in the high power LED packaging. At present, many manufacturers were confused about which kind of bonding technology they should choose. In this study, the high power LED devices from Cree and Lumileds were employed to study their die-bonding technologies. For the tested Cree's products, the initial interface had few voids before aged, however, under the action of injection current, the voids would initiated and propagated along the bonding boundary between LED chip and heats sink. For the tested Rebel LEDs, the crack and delamination of bonding pads were observed at the LED chip side.
机译:芯片键合技术在大功率LED封装的散热过程中起着关键作用。目前,许多制造商对于应该选择哪种粘合技术感到困惑。在这项研究中,采用了Cree和Lumileds的高功率LED器件来研究其芯片键合技术。对于经过测试的Cree产品,初始界面在老化之前几乎没有空隙,但是,在注入电流的作用下,空隙会沿着LED芯片和散热器之间的结合边界引发并传播。对于经过测试的Rebel LED,在LED芯片一侧观察到焊盘的裂纹和分层。

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