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Failure analysis of die-bonding interfaces between LED chip and heat sink

机译:LED芯片与散热器模切界面的故障分析

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The die bonding technology played a key role during the heat dissipating process in the high power LED packaging. At present, many manufacturers were confused about which kind of bonding technology they should choose. In this study, the high power LED devices from Cree and Lumileds were employed to study their die-bonding technologies. For the tested Cree's products, the initial interface had few voids before aged, however, under the action of injection current, the voids would initiated and propagated along the bonding boundary between LED chip and heats sink. For the tested Rebel LEDs, the crack and delamination of bonding pads were observed at the LED chip side.
机译:模具粘接技术在高功率LED封装中的散热过程中发挥了关键作用。目前,许多制造商对他们应该选择的哪种粘接技术感到困惑。在本研究中,采用来自Cree和LumiLeds的高功率LED器件来研究其芯片粘合技术。对于测试的Cree的产品,初始界面在老化之前几乎没有空隙,然而,在注射电流的作用下,空隙将沿着LED芯片之间的键合边界发起并传播。对于测试的反叛LED,在LED芯片侧观察到粘合垫的裂缝和分层。

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