首页> 外文会议>IEEE Conference on Electrical Performance of Electronic Packaging and Systems >Decoupling capacitor stacked chip (DCSC) in TSV-based 3D-ICs
【24h】

Decoupling capacitor stacked chip (DCSC) in TSV-based 3D-ICs

机译:基于TSV的3D-IC中的去耦电容堆叠芯片(DCSC)

获取原文

摘要

In this paper, we introduce a new decoupling capacitor stacked chip (DCSC) with discrete capacitors and through-silicon-vias (TSVs) that can overcome the limitations of the conventional decoupling capacitor solutions such as expensive on-chip NMOS capacitor and package-level discrete decoupling capacitor with narrow-band. The key idea of the proposed TSV-based DCSC is mounting the decoupling capacitors such as silicon-based NMOS capacitor and discrete capacitor on the backside of a chip and connecting the capacitors to the on-chip PDN through TSVs. Therefore, the TSV-based DCSC provides the lowest parasitic inductance (ESL: under several tens pH) through a short interconnections between the on-chip PDN and decoupling capacitors as well as the largest capacitance (up to several uF) by stacking the additional decoupling capacitors to 3D-IC systems.
机译:在本文中,我们引入了一种新的去耦电容堆叠芯片(DCSC),具有离散电容器和通过硅通孔(TSV),可以克服传统的解耦电容器解决方案(如昂贵的片上NMOS电容和包装级)的限制具有窄带的离散分离电容。所提出的基于TSV的DCSC的关键思想是在芯片的背面上安装D去耦电容,例如基于硅基的NMOS电容器和离散电容,并通过TSV将电容器连接到片上PDN。因此,基于TSV的DCSC通过片上PDN和去耦电容器之间的短互连以及通过堆叠额外的去耦,提供最低的寄生电感(ESL:在几十pH下),以及通过堆叠额外的去耦(最多几个UF)电容到3D-IC系统。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号