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Study on Failure Mode and Mechanism of Bond Pad under Cu Ball Bonding Process using Wire Pull Test and Finite Element Modeling

机译:用电线拉动试验和有限元模拟Cu球键合工艺粘接垫失效模式及机理研究

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In this work, wire pull test combined with finite element analysis (FEA) were conducted to investigate failure mode and failure criterion for bond pad reliability assessment under Cu wire bond process. Pull test was conducted for bonded Cu wires with different pull locations changing from the first ball bond to the second wedge bond. Failure forces were recorded and failure site and modes were studied. The effect of pull location on failure mode was observed. Failure modes change from wire neck broken, ball lift, pad peel to wedge broken when pull location is changing from the first bond towards the second bond. Based on wire pull test and FEA simulation results, failure mechanism and failure criterion were developed for different Cu wire bond failure modes. The effects of wire loop height on pull test results and modeling stress were also investigated.
机译:在这项工作中,进行了电线拉动试验与有限元分析(FEA)相结合,以研究Cu线键合工艺下的键合垫可靠性评估的故障模式和故障标准。对于粘合的Cu导线进行拉动试验,其不同拉伸位置从第一球键改变为第二楔形键。记录失败部队,研究了故障部位和模式。观察到拉动位置对故障模式的影响。失效模式从钢丝颈部变化,滚珠升降机,垫剥离时拉动位置从第一键变为第二个键时。基于电线拉动试验和FEA仿真结果,开发了针对不同的Cu线粘结失效模式开发了故障机构和故障标准。还研究了线圈高度对拉动试验结果和建模应力的影响。

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