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Multi-Bit Memories Fabricated through Mechanical and Plasma Induced Deformation of Layered Semiconductors

机译:通过机械和等离子体诱导层叠半导体的变形制造的多点存储器

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To realize hardware-based artificial intelligence (AI) systems for practical applications, it is necessary to create new memory devices with multiple (or analog-tunable) long-lasting memory states.[1] In our work, we identify that the interlayer deformation in layered semiconductors can form multiple long-lasting, metastable charge-trapping states, which can be exploited to fabricate memory transistors with multi-bit data storage states. We have demonstrated that both plasma treatment and mechanical shear exfoliation can be used to generate such charge-trapping states, and the fabricated MoS_2 and WSe_2 memory transistors have 2-bit and 3-bit data storage states with year- and day-scale retention times, respectively. This work advances the scientific and technical knowledge for manipulating charge memory states in layered materials and producing multi-bit memory components.
机译:为了实现实际应用的基于硬件的人工智能(AI)系统,有必要创建具有多个(或模拟可调)的长持久内存状态的新存储设备。[1]在我们的工作中,我们认为层状半导体中的层间变形可以形成多个长持久的亚稳电荷捕获状态,这可以利用以制造具有多位数据存储状态的存储器晶体管。我们已经证明,两种等离子体处理和机械剪切剥离可用于产生这种电荷捕获状态,并且制造的MOS_2和WSE_2存储器晶体管具有2位和3位数据存储状态,具有年度和日级保留时间, 分别。这项工作推进了用于操纵层状材料中的充电存储状态并产生多位存储器组件的科学和技术知识。

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