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Reliability analysis of low-Ag BGA solder joints using four failure criteria

机译:使用四个失效标准对低银BGA焊点进行可靠性分析

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The appropriate selection of failure criterion for solder joint studies is necessary to correctly estimate reliabilitylife. The objective of this study is to compare the effect of different failure criteria on the reliability life estimation.The four failure criteria in this study are a 20% resistance increase defined in the IPC-9701A standard, a resistancebeyond 500Ω, an infinite resistance (hard open), and a failure criterion based on X and R control charts.Accelerated thermal cycling conditions of a low-silver BGA study included 0°C to 100 °C with ten minute dwelltimes and -40°C to 125°C with ten minute dwell times. The results show that the life estimation based on X and Rfailure criterion is very similar to the life estimation when a 20% resistance increase defined in the IPC-9701Afailure criterion is used. The results also show that the reliability life would be overestimated if the failure criterionof a resistance threshold of 500Ω or an infinite resistance (hard open) is used.
机译:为了正确评估可靠性,必须为焊接接头研究选择适当的失效准则 生活。这项研究的目的是比较不同失效准则对可靠性寿命估算的影响。 这项研究中的四个失败标准是IPC-9701A标准中定义的电阻增加20%,即电阻 超过500Ω时,将具有无限电阻(硬断开)以及基于X和R控制图的故障判据。 低银BGA研究的加速热循环条件包括0°C至100°C的停留时间为十分钟 十分钟的保压时间和-40°C至125°C的时间。结果表明,基于X和R的寿命估计 IPC-9701A中定义的电阻增加20%时,失效准则与寿命估算非常相似 使用故障准则。结果还表明,如果采用失效准则,则可靠性寿命将被高估。 使用500Ω的电阻阈值或无限电阻(硬开路)。

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