首页> 外文会议>ASME/JSME thermal engineering joint conference;AJTEC2011 >Fabrication of Thermoelectric La_(0.95)sSr_(0.05)CoO_3 Thin Film and Seebeck Coefficient Measurement
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Fabrication of Thermoelectric La_(0.95)sSr_(0.05)CoO_3 Thin Film and Seebeck Coefficient Measurement

机译:La_(0.95)sSr_(0.05)CoO_3热电薄膜的制备及塞贝克系数的测量

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The P-type perovskite oxides La_(1-x)Sr_xCoO_3 are a promising group of complex oxide thermoelectric (TE) materials because of its a higher Seebeck coefficient. In this paper, the La_(0.95)sSr_(0.05)CoO_3 thin film was prepared by spin coating. A custom-made MEMS (micro-electromechanical system) based device was used to measure the voltage output and Seebeck coefficient of the thin film. The measured Seebeck coefficient of the thin film was 350 μV/K.
机译:由于其较高的塞贝克系数,P型钙钛矿氧化物La_(1-x)Sr_xCoO_3是一组有前途的复合氧化物热电(TE)材料。本文通过旋涂法制备了La_(0.95)sSr_(0.05)CoO_3薄膜。使用定制的基于MEMS(微机电系统)的设备来测量薄膜的电压输出和塞贝克系数。测得的薄膜的塞贝克系数为350μV/ K。

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