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Reliability consequences of the chip-package interactions

机译:芯片-封装相互作用的可靠性后果

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In general an IC needs to be assembled before being put on a microelectronics board by the end customer. The materials of which the IC is made and the materials for the assembly normally have different thermo-mechanical behavior. Temperature changes during manufacturing, testing and application will therefore cause stresses in the materials. These stresses, in extreme cases, may cause serious damages to the ICs, especially at the corners of the chip. Besides efforts of process improvements and material optimization for both packaging and IC manufacturing, proper measures need to be taken in IC design in order to eliminate/suppress the problem sufficiently. Towards this end, Virtual Prototyping is performed to estimate the stresses within the backend stack of the chip. With the help of these simulations, the most sensitive locations within the structure are identified; these may lead to design rules. This paper described two industrial case studies in which chip-package interactions are found to be crucial for the reliability of the product.
机译:通常,在最终用户将IC放入微电子板上之前,需要先组装IC。制成IC的材料和用于组装的材料通常具有不同的热机械行为。因此,制造,测试和应用过程中的温度变化将导致材料应力。在极端情况下,这些应力可能会严重损坏IC,尤其是在芯片的角部。除了在封装和IC制造方面进行工艺改进和材料优化方面的努力外,还需要在IC设计中采取适当的措施,以充分消除/抑制问题。为此,执行虚拟原型以估计芯片后端堆栈内的压力。借助这些模拟,可以识别出结构中最敏感的位置。这些可能会导致设计规则。本文描述了两个工业案例研究,其中发现芯片与封装之间的相互作用对于产品的可靠性至关重要。

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