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A STUDY OF COPPER DISSOLUTION IN Pb-FREE SOLDER FOUNTAIN SYSTEMS

机译:无铅焊料喷泉体系中铜溶解的研究

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Implementation of a Pb-free assembly process implies that rework and selective solder attachment of through-hole components with Pb-free alloys may also be required. The processes are physically similar to wave soldering, but with longer contact times. Exposure to radiant and convective heat over the solder pot is often the only preheat that the PWA receives, so longer contact times are required compared to wave soldering. The Pb-free alloy in common use for wave soldering, Sn96.5Ag3.0Cu05, (SAC 305), was expected to dissolve copper from the board pads, traces, and component leads at a higher rate than traditional SnPb alloys. The rate at which Cu is dissolved could be dependent upon a number of factors, including solder alloy, solder and board temperature, solder flow rate, copper alloy, copper grain structure, and the physical flow characteristics of the solder over the board (laminar, turbulent). Previously published information indicated the dissolution rates for high-Sn alloys were greater than for SnPb (1,2). This predicted behavior was observed in both soldering and HASL (Hot Air Solder Leveling) operations (3, 4). As a result of the higher expected dissolution rate, the allowable immersion time might not be long enough to allow rework when using high-Sn alloys. Current immersion time requirements range from less than 20 seconds for initial soldering of simple components on low-mass boards to approx. 60 seconds for rework of some connectors on highmass boards. An investigation was conducted in two phases to study the effects of contact time on dissolution of copper. In the first phase, copper wires of various diameters were used as an “analog” of a circuit board trace. Candidate alloys were compared as to the time required to dissolve the wire. The test was conducted using a production mini-wave, to ensure that the flow dynamics of the solder were what a PWA would experience in the actual process. In the second phase, the two alloys with the lowest dissolution rates in Phase 1 were then compared using actual plated traces to verify that the wire dissolution data could be extrapolated to actual PWAs. Sn63Pb37 (SN63) alloy was also tested as a comparison baseline.The findings from this investigation indicate that even small alloying additions to high-Sn solders can drastically alter the dissolution rate. Both the doped SnCu and 4-part alloy showed the lowest dissolution rate of the alloys tested. The dissolution rates were nearly four times lower than for SAC305. Both of these alloys are commercially available from several sources, and both are less expensive than SAC 305. The doped SnCu, however, has more limited reliability data available compared to the 4-part alloy.
机译:无铅组装工艺的实施意味着通孔元件与无铅合金的返工和选择性焊接也可能需要。该过程在物理上与波峰焊相似,但是接触时间更长。 PWA通常仅通过焊锅暴露在辐射热和对流热中,因此与波峰焊相比,需要更长的接触时间。普遍用于波峰焊的无铅合金Sn96.5Ag3.0Cu05(SAC 305)可以以比传统SnPb合金更高的速率溶解来自电路板焊盘,走线和组件引线的铜。铜的溶解速度可能取决于许多因素,包括焊料合金,焊料和电路板温度,焊料流速,铜合金,铜晶粒结构以及焊料在电路板上的物理流动特性(层状,湍流)。先前发布的信息表明,高锡合金的溶出速率大于锡铅(1,2)。在焊接和HASL(热空气焊平)操作中都观察到了这种预测行为(3、4)。由于较高的预期溶解速度,使用高锡合金时,允许的浸没时间可能不够长,无法进行返工。当前的浸入时间要求范围从少于20秒到在低质量板上初次焊接简单组件的时间到大约20秒不等。返工60秒,可对高品质板上的某些连接器进行返工。分两个阶段进行了研究,以研究接触时间对铜溶解的影响。在第一阶段,将各种直径的铜线用作电路板走线的“模拟”。比较了候选合金的溶解时间。该测试是使用生产小波进行的,以确保焊料的流动动力学是PWA在实际过程中所经历的。在第二阶段中,然后使用实际电镀痕迹比较在阶段1中具有最低溶解速率的两种合金,以验证焊丝溶解数据可以外推至实际PWA。 Sn63Pb37(SN63)合金也作为比较基准进行了测试。调查结果表明,即使在高Sn焊料中添加少量合金也会大大改变溶出速率。掺杂的SnCu和4组分合金均显示出所测试合金的最低溶解速率。溶出度比SAC305低近四倍。这两种合金都可以从几种来源商购获得,并且都比SAC 305便宜。但是,与4组分合金相比,掺杂的SnCu具有更有限的可靠性数据。

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