首页> 外文会议>Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference (CMP-MIC) >NANOCRYSTALLINE ALUMINA AND CERIA ABRASIVES IN CHEMICAL-MECHANICAL PLANARIZATION SLURRIES
【24h】

NANOCRYSTALLINE ALUMINA AND CERIA ABRASIVES IN CHEMICAL-MECHANICAL PLANARIZATION SLURRIES

机译:化学机械平面化浆液中的纳米氧化铝和铈陶瓷磨料

获取原文
获取外文期刊封面目录资料

摘要

Nanophase Technologies Corporation has developed concentrated aqueous dispersions of alumina and ceria nanoparticles as the abrasive components of CMP slurry formulations. The nanoparticles have a uniform particle size and have an extraordinarily high zeta potential. This enables extremely stable aqueous dispersions and allows polishing improvements such as increased planarity with reduced defectivity in general, and greater selectivity during STI polishing applications, to be realized. The physical properties of these nanocrystalline alumina and ceria dispersions will be presented, with particular emphasis on particle characteristics that permit the preparation of concentrated aqueous dispersions with controlled rheology. The manipulation of dispersion pH, including crossing the isoelectric point of the particles, will be presented. Finally, examples of typical particle size distributions for these dispersions will be shown.
机译:纳米相技术公司已开发出氧化铝和二氧化铈纳米颗粒的浓缩水分散液,作为CMP浆料配方的研磨组分。纳米颗粒具有均匀的粒度并且具有非常高的ζ电位。这实现了极其稳定的水分散体,并实现了抛光改进,例如提高了平面度,同时降低了缺陷率,并在STI抛光应用中实现了更高的选择性。将介绍这些纳米晶态氧化铝和二氧化铈分散体的物理性能,特别强调颗粒特性,这些特性允许制备具有受控流变性的浓缩水分散体。将介绍对分散液pH值的控制,包括穿越颗粒的等电点。最后,将显示这些分散体的典型粒度分布的实例。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号