ALL EPITAXIAL BaBi_4Ti_4O_(15) - LaNiO_3 HETEROSTRUCTURES

摘要

Bismuth-based layer-structured ferroelectric oxides are gaining much attention for ferroelectric thin film applications due to their low fatigue. Epitaxial thin films of these layered ferroelectric oxides grown on epitaxial perovskite-type conducting oxide electrodes such as LaNiO_3 are known to further improve the fatigue resistance. In this paper the ferroelectric properties of BaBi_4Ti_4O_(15) films grown by pulsed laser deposition on epitaxial LaNiO_3/SrTiO_3(l00) and LaNiO_3/YSZ/Si(100) substrates are presented. BaBi_4Ti_4O_(15) thin films with mixed a - and c - orientation exhibit ferroelectric hysteresis loops with a remanent polarization P_r of 2 μC/cm~2 and a coercive field E_c of about 75 kV/cm. The effect of the deposition parameters on thin film orientation, morphology and the ferroelectric properties of BBiT are discussed.