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Managing leakage for transient data: decay and quasi-static 4T memory cells

机译:管理瞬态数据的泄漏:衰减和准静态4T存储单元

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Much on-chip storage is devoted to transient, often short-lived, data. Despite this, virtually all on-chip array structures use six-transistor (6T) static RAM cells that store data indefinitely. In this paper we propose the use of quasi-static four-transistor (4T) RAM cells. Quasi-static 4T cells provide both energy and area savings. These cells have no connection to Vdd and thus inherently provide decay functionality: values are refreshed upon access but discharge over time without use. This makes 4T cells uniquely well-suited for predictive structures like branch predictors and BTBs where data integrity is not essential. We use quantitative evaluations (both circuit-level and cycle-level) to explore the design space and quantify the opportunities. Overall, 4T-based branch predictors offer 12-33% area savings and 60-80% leakage savings with minimal performance impact. More broadly, this paper suggests a new view of how to support transient data in power-aware processors.
机译:许多片上存储专用于瞬态数据(通常是短暂的数据)。尽管如此,实际上,所有片上阵列结构都使用可无限期存储数据的六晶体管(6T)静态RAM单元。在本文中,我们建议使用准静态四晶体管(4T)RAM单元。准静态4T电池既节省了能源,又节省了面积。这些单元与Vdd没有任何关系,因此固有地提供了衰减功能:访问时会刷新这些值,但随着时间的推移会放电而无需使用。这使得4T细胞特别适合于预测结构,例如分支预测变量和BTB,而数据完整性不是必不可少的。我们使用定量评估(电路级和循环级)来探索设计空间并量化机会。总体而言,基于4T的分支预测器可节省12-33%的面积,并节省60-80%的泄漏,而对性能的影响最小。更广泛地讲,本文提出了一种新的观点,即如何在功耗意识的处理器中支持瞬态数据。

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