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Hierarchical extraction of 3D interconnect capacitances in large regular VLSI structures

机译:大型常规VLSI结构中3D互连电容的分层提取

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For submicron integrated circuits, 3D numerical techniques are required to accurately compute the values of the interconnect capacitances. In this paper, we describe an hierarchical capacitance extraction method that efficiently extracts 3D interconnect capacitances of large regular layout structures such as RAMs and array multipliers. The method is based on a 3D capacitance extraction method that uses a boundary-element technique and approximate matrix inversion to efficiently compute 3D interconnect capacitances for flat layout descriptions. The latter method has a computational complexity O(Z), where Z is the size of the layout. In the worst case, the hierarchical extraction method has computational complexity O(B+U), where B is the total size of the boundary area between all circuit parts in which the circuit is decomposed, and U is the total size of the parts of the circuit that are unique. The method has been implemented in the layout-to-circuit extractor SPACE that uses as input a hierarchical layout description of the circuit. It produces as output a netlist containing transistors, resistances, ground capacitances, and coupling capacitances between conductor parts that are near to each other.
机译:对于亚微米集成电路,需要3D数值技术来准确计算互连电容的值。在本文中,我们描述了一种分层电容提取方法,该方法可以有效地提取大型常规布局结构(例如RAM和阵列乘法器)的3D互连电容。该方法基于3D电容提取方法,该方法使用边界元素技术和近似矩阵求逆来有效地计算3D互连电容,以进行平面布局描述。后一种方法具有计算复杂度O(Z),其中Z是布局的大小。在最坏的情况下,分层提取方法的计算复杂度为O(B + U),其中B是要分解电路的所有电路部分之间的边界区域的总大小,而U是其中分解部分的总大小独特的电路。该方法已在布局到电路提取器SPACE中实现,该提取器使用电路的分层布局描述作为输入。它产生一个包含晶体管,电阻,接地电容和彼此靠近的导体部分之间的耦合电容的网表作为输出。

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