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Electrical Properties of Graphite/p-Type Homoepitaxial Diamond Contact

机译:石墨/ p型同质外延金刚石触头的电性能

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摘要

We have studied the electrical properties of the graphitic electrodes formed in boron-doped homoepitaxial diamond films in order to make reliable ohmic contacts in diamond-based electronic devices. Boron-doped homoepitaxial diamond films were synthesized by gas-phase doping of boron during the chemical vapor deposition growth. The graphitization of diamond by Ar ion implantation was utilized for the graphitic electrodes. The electrical properties of graphite/diamond contacts were investigated by using the current-voltage measurement. The specific contact resistance was characterized by applying circular transmission line model (CTLM) extrapolation method and determined to be 1.18 Ω·cm~2.
机译:我们已经研究了在掺硼的同质外延金刚石薄膜中形成的石墨电极的电性能,以便在基于金刚石的电子设备中形成可靠的欧姆接触。在化学气相沉积生长过程中,通过硼的气相掺杂合成了掺硼同质外延金刚石薄膜。通过Ar离子注入将金刚石石墨化用于石墨电极。通过使用电流-电压测量研究了石墨/金刚石触点的电性能。通过采用圆形传输线模型(CTLM)外推法表征比接触电阻,确定为1.18Ω·cm〜2。

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