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High Power 808nm Diode Lasers Grown By MOCVD Using MO Group V Sources in N_2 Ambient

机译:MOCVD在N_2周围环境中使用MO Group V源通过MOCVD生长的高功率808nm二极管激光器

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摘要

In this contribution, the recent result of AlGaAs/GaAs high power diode laser emitting at 808nm grown by MOCVD using TBAs as group-V source and N_2 as carrier gas will be presented. This is the first report so far the high power AlGaAs/GaAs diode laser prepared by MOCVD growth using TBA group V MO source in 100% nitrogen ambient. Broad area stripe lasers has been prepared with stripe width of 150 μm. Lasing has been successfully achieved from the wafer with a low threshold current density of 267 A/cm~2 with the laser cavity length of 1000 μm. Laser diode devices with different cavity lengths, 1200 μm, 1000 μm and 800 μm, were cleaved to obtain the internal loss, α_i, and internal quantum efficiency, η_i, of the devices. The α_i received was about 9.7 cm~(-1) and the quantum efficiency, η_i, of 81% was deduced.
机译:在此贡献中,将展示通过使用TBA作为V组源和N_2作为载气的MOCVD生长的在808nm处发射的AlGaAs / GaAs高功率二极管激光器的最新结果。迄今为止,这是第一份报告,它是通过在100%氮气环境中使用TBA组V MO源通过MOCVD生长制备的高功率AlGaAs / GaAs二极管激光器。已经准备了条纹宽度为150μm的广域条纹激光器。激光腔长度为1000μm的低阈值电流密度为267 A / cm〜2的晶片已经成功实现了激光发射。切割具有不同腔长1200μm,1000μm和800μm的激光二极管器件,以获得器件的内部损耗α_i和内部量子效率η_i。接收到的α_i约为9.7 cm〜(-1),推论出量子效率η_i为81%。

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