首页> 外文会议>International Conference on Algorithmic Learning Theory(ALT 2005); 20051008-11; Singapore(SG) >An Analysis of the Anti-learning Phenomenon for the Class Symmetric Polyhedron
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An Analysis of the Anti-learning Phenomenon for the Class Symmetric Polyhedron

机译:类对称多面体的反学习现象分析

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This paper deals with an unusual phenomenon where most machine learning algorithms yield good performance on the training set but systematically worse than random performance on the test set. This has been observed so far for some natural data sets and demonstrated for some synthetic data sets when the classification rule is learned from a small set of training samples drawn from some high dimensional space. The initial analysis presented in this paper shows that anti-learning is a property of data sets and is quite distinct from over-fitting of a training data. Moreover, the analysis leads to a specification of some machine learning procedures which can overcome anti-learning and generate machines able to classify training and test data consistently.
机译:本文讨论了一种不寻常的现象,其中大多数机器学习算法在训练集上都能产生良好的性能,但在系统上要比测试集上的随机性能差。到目前为止,对于某些自然数据集已经观察到了这一点,并且当从从某些高维空间中抽取的一小套训练样本中学习了分类规则时,对于某些综合数据集也证明了这一点。本文提出的初步分析表明,反学习是数据集的一个属性,与过度拟合训练数据完全不同。此外,分析得出了一些机器学习程序的规范,这些程序可以克服反学习并生成能够一致地对训练和测试数据进行分类的机器。

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