首页> 外文会议>International conference on phenomena in ionized gases;ICPIG 2007 >Fabrication of Submicron-Dot-Arrayed Carbon Nanotube Emitters Using DC Plasma Enhanced Chemical Vapour Deposition
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Fabrication of Submicron-Dot-Arrayed Carbon Nanotube Emitters Using DC Plasma Enhanced Chemical Vapour Deposition

机译:使用直流等离子体增强化学气相沉积法制备亚微米级点阵碳纳米管发射极

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Vertically aligned carbon nanotubes (VACNTs) were grown on submicron-sized dot array substrate,which have a dot size of 400 nm and various dot intervals using direct current plasma enhancedchemical vapour deposition (DC-PECVD) method. The dot catalyst array was fabricated by lift-offprocess using electron beam lithography technique. Field emission performance was improved byadjusting the dot interval, where the on-set electric field was reduced from 3.6 V/μm in the case of0.3 μm interval to 1.1 V/μm of 6 μm interval. Analysis based upon Fowler-Nordheim theory turnedout that the field enhancement factor β showed the largest value of about 3380, when the dot intervalexceeded twice of the length of CNTs because of reduction of field shielding effect.
机译:垂直排列的碳纳米管(VACNTs)使用直流等离子体增强化学气相沉积(DC-PECVD)方法在亚微米尺寸的点阵列基板上生长,该基板具有400 nm的点尺寸和各种点间隔。通过使用电子束光刻技术的剥离工艺来制造点催化剂阵列。调整点间隔可以提高场发射性能,其中点电场的间隔从0.3 V /μm的3.6 V /μm降低到6μm的1.1 V /μm。基于Fowler-Nordheim理论的分析结果表明,当点间隔超过碳纳米管长度的两倍时,由于场屏蔽效应的降低,场增强因子β的最大值约为3380。

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