首页> 外文会议>IMAPS 40th international symposium on microelectronics >Effects of peak temperature reflow on the solder joint strength of lead-free solder ball on semiconductor units (PBGA) and correlation of the adhesion strength to intermetallic thickness and type
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Effects of peak temperature reflow on the solder joint strength of lead-free solder ball on semiconductor units (PBGA) and correlation of the adhesion strength to intermetallic thickness and type

机译:峰值温度回流对半导体单元(PBGA)上无铅焊球焊点强度的影响以及粘合强度与金属间厚度和类型的关系

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摘要

This research paper focused on the effects of peak reflow temperature on the solder joint strength and interfacial reaction of 95.5%Sn-3.8%Ag-0.7%Cu solder ball on PBGA packages with Cu/Ni/Au pad metallization. PBGA units were reflowed at peak temperatures of 235°C,240°C,245°C,250°C,255°C,and 260°C. Lead free solder requires a ramp to peak profile unlike the commonly used ramp-soak-peak profile for leaded solder. The resulting reflowed samples were tested with the ball shear machine to evaluate the solder joint strength. Solder ball shear strength gradually increases from peak reflow temperature of 235°C until peak temperature of 250°C. At above peak reflow temperature of 250°C,the solder ball shear strength was significantly reduced. Fracture mode of the ball shear test was found to be a mix of ductile and interfacial fracture. Observations of the interfacial fracture increases as the peak reflow temperature gets higher. It was found that the higher occurrence of interfacial fracture could contribute to the lower solder ball shear strength. During reflow,Au in the pad metallization diffuses into the bulk solder while Ni reacts with Sn in the bulk solder to form intermetallic compound (IMC). IMC thickness increases gradually from peak reflow temperature of 235°C to peak reflow temperature of 260°C. At peak reflow temperature of 255°C where the solder ball shear strength reduced significantly,the mean IMC thickness reach 0.945μm. The IMC layer continues to grow at peak reflow temperature of 260°C where the mean IMC thickness measured was 0.963μm. From the EDX analysis,the composition of the IMC layer was found to consists of Cu,Ni,and Sn. Morphology of the IMC layer changes from a needle-like structure at peak reflow temperature of 235°C to a more planar structure at peak reflow temperature of 260°C. The morphological change could lead to lower shear strength as the surface of the IMC layer is smoother and easier to slip on the application of the shear force. Key Words: Peak Reflow Temperature,Solder Joint Strength,Intermetallic.
机译:本文研究了峰值回流温度对在具有Cu / Ni / Au焊盘金属化的PBGA封装上95.5%Sn-3.8%Ag-0.7%Cu焊料球的焊点强度和界面反应的影响。将PBGA单元在235°C,240°C,245°C,250°C,255°C和260°C的峰值温度下回流。与通常使用的含铅焊料的斜峰峰值曲线不同,无铅焊料要求斜率达到峰值曲线。用球形剪切机测试所得的回流焊样品,以评估焊点强度。焊球的剪切强度从峰值回流温度235°C到峰值温度250°C逐渐增加。在高于峰值回流温度250°C时,焊球的剪切强度显着降低。球剪切试验的断裂模式被发现是韧性断裂和界面断裂的混合。随着峰值回流温度的升高,界面裂缝的观察值增加。发现界面断裂的发生率较高可能有助于降低焊球的剪切强度。在回流期间,焊盘金属化层中的Au扩散到块状焊料中,而Ni与块状焊料中的Sn反应形成金属间化合物(IMC)。从峰值回流温度235°C到峰值回流温度260°C,IMC厚度逐渐增加。在255°C的峰值回流温度下,焊球的剪切强度显着降低,IMC的平均厚度达到0.945μm。 IMC层在260°C的峰值回流温度下继续生长,此时测得的IMC平均厚度为0.963μm。通过EDX分析,发现IMC层的成分由Cu,Ni和Sn组成。 IMC层的形态从峰值回流温度为235℃的针状结构改变为峰值回流温度为260℃的更平坦的结构。由于IMC层的表面更光滑并且在施加剪切力时更容易滑动,因此形态变化可能导致较低的剪切强度。关键词:峰值回流温度,焊点强度,金属间化合物。

著录项

  • 来源
  • 会议地点 San Jose CA(US)
  • 作者单位

    Freescale Semiconductor Malaysia Sdn. Bhd.Petaling Jaya, 47300, Selangor, Malaysia;

    Freescale Semiconductor Malaysia Sdn. Bhd.Petaling Jaya, 47300, Selangor, Malaysia,Department of Materials Science and Engineering, Malaysia University Science and Technology (MUST)Petaling Jaya, 47301, Selangor, Malaysia;

    Department of Materials Science and Engineering, Malaysia University Science and Technology (MUST)Petaling Jaya, 47301, Selangor, Malaysia;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 微电子学、集成电路(IC);
  • 关键词

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