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Accumulator-based self-adjusting output data compression for embedded word-organized DRAMs

机译:嵌入式字组织DRAM的基于累加器的自调节输出数据压缩

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摘要

An approach for periodic online testing of embedded DRAMs is presented. The fault-free memory contents are compressed, using accumulator-based response compaction, and periodically compared to subsequently compressed test data. The compressed signature is updated concurrently with write operations, without need for recomputing. Comparisons with previously proposed schemes indicate that the proposed scheme results in considerable savings in hardware overhead.
机译:提出了一种定期进行嵌入式DRAM在线测试的方法。使用基于累加器的响应压缩来压缩无故障存储器的内容,并定期将其与随后压缩的测试数据进行比较。压缩签名与写操作同时更新,无需重新计算。与先前提出的方案的比较表明,提出的方案可节省大量硬件开销。

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