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Buffer trapping effects on knee walkout in GaN HEMTs

机译:GaN HEMT中缓冲俘获对膝盖罢工的影响

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摘要

A potential link between traps located in the buffer and the AC/DC dispersion commonly observed in GaN HEMTs is studied by simulating the device in class A amplifier operations. We have revealed that acceptor traps located in the buffer at energy level close to valence band (E
机译:通过模拟A类放大器操作中的器件,研究了位于缓冲器中的陷阱与GaN HEMT中常见的AC / DC色散之间的潜在联系。我们发现受体陷阱位于能级接近价带(E的能级)

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