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Study of XPS and ESR OF IBAD MoS_2 Composite Films

机译:IBAD MoS_2复合薄膜的XPS和ESR研究

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MoS_2+Ag(Cu)composite films were deposited by ion beam assisted deposition technology. The oxidation of these films was investigated by XPS and ESR. In an atmosphere in which the relative humidity (RH) is 60%, the results of the XPS analysis show that the oxidation of MoS_2 was accelerated when Cu was doped into MoS_2, while the oxidation of the Ag + MoS_2 film was inhibited. The XPS results indicate the presence Mo~(6+) ions in the MoS_2 + Cu film, but Mo~(5+) ions in this film were not found using ESR; In the Ag + MoS_2 film, Mo~(6+) ions were not found by XPS, but Mo~(5+) ions were found by ESR. This indicates that the chemical environment greatly influences the presence of Mo~(6+) ions.
机译:采用离子束辅助沉积技术沉积了MoS_2 + Ag(Cu)复合薄膜。通过XPS和ESR研究了这些膜的氧化。 XPS分析的结果表明,在相对湿度(RH)为60%的气氛中,当将Cu掺杂到MoS_2中时,MoS_2的氧化被加速,而抑制了Ag + MoS_2膜的氧化。 XPS结果表明在MoS_2 + Cu膜中存在Mo〜(6+)离子,但使用ESR未发现该膜中的Mo〜(5+)离子。在Ag + MoS_2薄膜中,XPS未发现Mo〜(6+)离子,而ESR发现了Mo〜(5+)离子。这表明化学环境极大地影响了Mo〜(6+)离子的存在。

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